Semiconductor Materials and Device Characterization   [Archived Catalog]
2009-2010 Undergraduate Studies Bulletin
   
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ELCT 574 - Semiconductor Materials and Device Characterization

Credits: 3
Semiconductor material and device characterization; resistivity, carrier and doping density, contact resistance, Schottky barriers, series resistance, defects, trapped charges, and carrier lifetime.

Prerequisites
ELCT 363 or equivalent



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